Current-Voltage Measurements on Indium Phosphide Schottky Diodes

AuthID
 P-00N-T7V
2
Author(s)
Sequeira, CAC
·
Tipo de Documento
Article
Year published
2008
Publicado
in Defect and Diffusion Forum, ISSN: 1012-0386
Volume: 283-286, Páginas: 577-582
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Publication Identifiers
SCOPUS: 2-s2.0-85044349176
Source Identifiers
ISSN: 1012-0386
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