Robust Weak Anti-Localisation Effect in Strongly Textured Nanocrystalline Bi2Se3 Samples

AuthID
 P-00N-YQ5
3
Author(s)
Pereira, VMM
·
Henriques, MSC
·
Tipo de Documento
Article
Year published
2018
Publicado
in PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526
Volume: 536, Páginas: 51-55 (5)
Conference
International Conference on Strongly Correlated Electron Systems (Sces), Date: JUL 17-21, 2017, Location: Prague, CZECH REPUBLIC, Patrocinadores: Charles Univ, Fac Math & Phys, Dept Condensed Matter Phys
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Publication Identifiers
SCOPUS: 2-s2.0-85035016776
Wos: WOS:000431075600014
Source Identifiers
ISSN: 0921-4526
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