Using Local Binary Patterns in Speckle Image Analysis

AuthID
P-00P-32Z
5
Author(s)
Bento, L
·
Tavern, L
·
12
Editor(es)
Vrdoljak,B;Tijan,E;Grbac,TG;Sruk,V;Cicin Sain,M;Ribaric,S;Skala,K;Koricic,M;Mauher,M;Gros,S;Pale,P;Janjic,M
Tipo de Documento
Proceedings Paper
Year published
2018
Publicado
in 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings
Páginas: 167-171
Conference
41St International Convention on Information and Communication Technology, Electronics and Microelectronics, Mipro 2018, Date: 21 May 2018 through 25 May 2018, Patrocinadores: Ericsson Nikola Tesla;et al.;HEP - Croatian Electricity Company Zagreb;InfoDom;Koncar-Electrical Industries;T-Croatian Telecom
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Publication Identifiers
SCOPUS: 2-s2.0-85050239741
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