New Method for Phase Characterization of Nonlinear Distortion Products

AuthID
 P-000-72A
3
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2005
Publicado
in 2005 IEEE MTT-S International Microwave Symposium, Vols 1-4 in IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, ISSN: 0149-645X
Volume: 2005, Páginas: 971-974 (4)
Conference
Ieee Mtt-S International Microwave Symposium, Date: JUN 11-17, 2005, Location: Long Beach, CA, Patrocinadores: IEEE Microwave Theory & Technol Soc
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Publication Identifiers
SCOPUS: 2-s2.0-33646727894
Wos: WOS:000234561201093
Source Identifiers
ISSN: 0149-645X
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