Shallow Excited-States Of The 1014-Mev Cu Related Optical-Center In Silicon

AuthID
P-00P-3G2
5
Author(s)
DUARTE, AJ
·
STEELE, AG
·
DAVIES, G
·
LIGHTOWLERS, EC
3
Editor(es)
Davies, G; Deleo, GG; Stavola, M
Tipo de Documento
Proceedings Paper
Year published
1992
Publicado
in PROCEEDINGS OF THE 16TH INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS, PTS 1-3 in Materials Science Forum, ISSN: 0255-5476
Volume: 83, Páginas: 191-196 (6)
Conference
16Th International Conf On Defects In Semiconductors ( Icds-16 ), Date: JUL 22-26, 1991, Location: LEHIGH UNIV, BETHLEHEM, PA, Patrocinadores: USAF, OFF SCI RES, BANDGAP TECHNOL, DEF ADV RES PROJECTS AGCY, EASTMAN KODAK, FORD MOTOR, FUJITSU LABS, IBM, KAWASAKI STEEL, LEHIGH UNIV, MOBIL SOLAR ENERGY, Host: LEHIGH UNIV
Indexing
Publication Identifiers
Wos: WOS:A1992BW69F00031
Source Identifiers
ISSN: 0255-5476
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