Freestanding Silicon Nanocrystals with Extremely Low Defect Content

AuthID
P-002-6V2
4
Author(s)
Rowe, DJ
·
Anthony, RJ
·
Kortshagen, U
Tipo de Documento
Article
Year published
2012
Publicado
in PHYSICAL REVIEW B, ISSN: 1098-0121
Volume: 86, Número: 8
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84865701892
Wos: WOS:000308005600013
Source Identifiers
ISSN: 1098-0121
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