Optimised Filters for Texture Defect Detection

AuthID
 P-000-73N
1
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2005
Publicado
in 2005 International Conference on Image Processing (ICIP), Vols 1-5 in IEEE International Conference on Image Processing (ICIP), ISSN: 1522-4880
Volume: 3, Páginas: 3165-3168 (4)
Conference
Ieee International Conference on Image Processing (Icip 2005), Date: SEP 11-14, 2005, Location: Genoa, ITALY, Patrocinadores: IEEE
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Publication Identifiers
SCOPUS: 2-s2.0-33749253358
Wos: WOS:000235773304016
Source Identifiers
ISSN: 1522-4880
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