Influence of the Incident Angle on Energy Dependence of a Secondary Electron Emission Yield

AuthID
 P-00P-8AT
4
Author(s)
Belhaj, M
·
Gineste, T
·
Teodoro, MND
Tipo de Documento
Proceedings Paper
Year published
2013
Publicado
in 2013 IEEE 14TH INTERNATIONAL VACUUM ELECTRONICS CONFERENCE (IVEC) in IEEE International Vacuum Electronics Conference IVEC
Conference
14Th Ieee International Vacuum Electronics Conference (Ivec), Date: MAY 21-23, 2013, Location: Paris, FRANCE, Patrocinadores: IEEE, ESA, EDS, THALES, CBL Ceram Ltd, CST
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Wos®
Publication Identifiers
Wos: WOS:000327022700046
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