Experimental Investigation of the Influence of Electron Incidence Angle on the Total Electron Emission Yield of Silver

AuthID
 P-00P-8AV
7
Author(s)
Gineste, T
·
Belhaj, M
·
Teodoro, OMND
·
Pons, C
·
Puech, J
·
Balcon, N
Tipo de Documento
Proceedings Paper
Year published
2013
Publicado
in 2013 IEEE 14TH INTERNATIONAL VACUUM ELECTRONICS CONFERENCE (IVEC) in IEEE International Vacuum Electronics Conference IVEC
Conference
14Th Ieee International Vacuum Electronics Conference (Ivec), Date: MAY 21-23, 2013, Location: Paris, FRANCE, Patrocinadores: IEEE, ESA, EDS, THALES, CBL Ceram Ltd, CST
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Wos®
Publication Identifiers
Wos: WOS:000327022700229
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