Evaluating the Scalability of Test Buses

AuthID
 P-00P-8PJ
6
Author(s)
Amory, A
·
Moreira, M
·
Calazans, N
·
Moraes, F
·
6
Editor(es)
Nurmi, J; Ellervee, P; Indrusiak, LS; Vainio, O; Thombre, S; Raasakka, J
Tipo de Documento
Proceedings Paper
Year published
2013
Publicado
in INTERNATIONAL SYMPOSIUM ON SYSTEM-ON-CHIP (SOC)
Conference
15Th Annual International Symposium on System-On-Chip (Soc), Date: OCT 23-24, 2013, Location: Tampere, FINLAND, Patrocinadores: Tampere Univ Technol, Tallinn Univ Technol, Univ York, IEEE, Nokia Corp, IEEE Finland Sect, GETA Doctoral Sch, IEEE Circuits & Syst Soc
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Wos®
Publication Identifiers
Wos: WOS:000335010100023
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