Random Correction Using Large Coincidence Window for the Clear-Pem System

AuthID
P-00P-93V
6
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2013
Publicado
in 2013 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC) in IEEE Nuclear Science Symposium and Medical Imaging Conference, ISSN: 1082-3654
Conference
60Th Ieee Nuclear Science Symposium (Nss) / Medical Imaging Conference (Mic) / 20Th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors, Date: OCT 27-NOV 02, 2013, Location: Seoul, SOUTH KOREA, Patrocinadores: IEEE, Inst Elect & Elect Engineers, Nucl & Plasma Sci Soc
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Publication Identifiers
Wos: WOS:000347163501071
Source Identifiers
ISSN: 1082-3654
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