Error Prediction and Detection Methodologies for Reliable Circuit Operation Under Nbti

AuthID
 P-00P-AE8
3
Author(s)
Champac, V
·
dos Santos, MB
Tipo de Documento
Proceedings Paper
Year published
2014
Publicado
in 2014 IEEE INTERNATIONAL TEST CONFERENCE (ITC) in International Test Conference Proceedings, ISSN: 1089-3539
Conference
45Th Ieee International Test Conference (Itc), Date: OCT 21-23, 2014, Location: Seattle, DC, Patrocinadores: IEEE Comp Soc, Test Technol Tech Council, IEEE, IEEE Philadelphia Sect
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Wos®
Publication Identifiers
Wos: WOS:000370703300089
Source Identifiers
ISSN: 1089-3539
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