A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/Rf Circuits

AuthID
P-00P-C4Q
6
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2015
Publicado
in 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE) in Design Automation and Test in Europe Conference and Exhibition, ISSN: 1530-1591
Páginas: 1042-1047 (6)
Conference
Conference on Design Automation Test in Europe (Date), Date: MAR 09-13, 2015, Location: Alpexpo Congress Center, Grenoble, FRANCE, Patrocinadores: European Design & Automation Association, Elect Design Automation Consortium, IEEE Council on Elec Design Automation, European Elect Chips & Syst design Initiative, ACM Special Interest Grp on Design Automation, Russian Acad of Sciences, IEEE Comp Soc test technology tech Council (tttC), IEEE Solid-State Circuits Soc (SSCS), International Federation for Information Processing (IFIP), Ville De Grenoble, LETI, ST, MINALOGIC, Agence DEtudes et de Promotion de lIsere, Rhone Alpes, Grenoble Alpes, CMP, Systematic Paris Region Systems & ICT, Cluster SCC, JEITA, Synopsys, Mentor Graphics, Cadence, MathWorks, EUROTRAINING, Host: Alpexpo Congress Center
Indexing
Publication Identifiers
Wos: WOS:000380393200195
Source Identifiers
ISSN: 1530-1591
Export Publication Metadata
Info
At this moment we don't have any links to full text documens.