The Cu-Pl Defect and the Cus1Cui3 Complex

AuthID
 P-002-7R3
2
Author(s)
Tipo de Documento
Article
Year published
2012
Publicado
in PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526
Volume: 407, Número: 15, Páginas: 2967-2969 (3)
Conference
26Th International Conference on Defects in Semiconductors (Icds), Date: JUL 18-22, 2011, Location: Nelson, NEW ZEALAND, Patrocinadores: Univ Canterbury, Ind Res Ltd, MacDiarmid Inst
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Publication Identifiers
SCOPUS: 2-s2.0-84862000709
Wos: WOS:000305790800038
Source Identifiers
ISSN: 0921-4526
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