Turbulence Level Effects on Conventional Reflectometry Using 2D Full-Wave Simulations

AuthID
 P-00P-JZY
6
Author(s)
Vicente, J
·
Heuraux, S
·
Conway, GD
·
Ribeiro, T
Tipo de Documento
Article
Year published
2018
Publicado
in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748
Volume: 89, Número: 10
Conference
22Nd Biannual Topical Conference on High-Temperature Plasma Diagnostics (Htpd), Date: APR 16-19, 2018, Location: Gen Atom, San Diego, CA, Patrocinadores: Appl Nanotools, DtAcq Solut, Palomar Sci Instruments, Sydor Technologies, TAE Technologies, Telops, Host: Gen Atom
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-85052750431
Wos: WOS:000449144500152
Source Identifiers
ISSN: 0034-6748
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