A 125 Ms/S 10.4 Enob 10.1 Fj/Cony-Step Multi-Comparator Sar Adc with Comparator Noise Scaling in 65Nm Cmos

AuthID
P-00P-VBW
5
Author(s)
Liu, SL
·
Pileggi, L
·
Tipo de Documento
Proceedings Paper
Year published
2018
Publicado
in ESSCIRC 2018 - IEEE 44TH EUROPEAN SOLID STATE CIRCUITS CONFERENCE (ESSCIRC) in Proceedings of the European Solid-State Circuits Conference, ISSN: 1930-8833
Páginas: 22-25 (4)
Conference
44Th Ieee European Solid State Circuits Conference (Esscirc), Date: SEP 03-06, 2018, Location: Dresden, GERMANY, Patrocinadores: IEEE
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Publication Identifiers
Wos: WOS:000448159800004
Source Identifiers
ISSN: 1930-8833
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