Influence of the Domain Structure on Piezoelectric and Dielectric Properties of Relaxor Sbn Single Crystals

AuthID
P-00P-Y8G
8
Author(s)
Shikhova, VA
·
Ushakov, AD
·
Fedorovyh, VV
·
Anikin, VA
·
Esin, AA
·
Shur, VY
·
Ivleva, LI
Tipo de Documento
Proceedings Paper
Year published
2018
Publicado
in IOP Conference Series: Materials Science and Engineering, ISSN: 1757-8981
Volume: 443, Número: 1, Páginas: 012031
Conference
International Conference on Scanning Probe Microscopy, Spm 2018, Date: 26 August 2018 through 29 August 2018, Patrocinadores: et al.;NT-MDT Spectrum Instruments;Ostec-ArtTool Ltd.;Promenergolab LLC;Russian Foundation for Basic Research;Taylor and Francis Group
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-85057496437
Source Identifiers
ISSN: 1757-8981
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