Cluster Secondary Ion Emission of Silicon: An Influence of the Samples' Dimensional Features

AuthID
 P-00Q-4BG
11
Author(s)
Drozdov, MN
·
Belykh, SF
·
Gololobov, GP
·
Ieshkin, AE
·
Mazarov, P
·
Suvorov, DV
·
Fu, DJ
·
Pelenovich, V
·
Zeng, XM
·
Zuo, WB
Tipo de Documento
Letter
Year published
2019
Publicado
in RAPID COMMUNICATIONS IN MASS SPECTROMETRY, ISSN: 0951-4198
Volume: 33, Número: 3, Páginas: 323-325 (3)
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Publication Identifiers
Wos: WOS:000456172800009
Source Identifiers
ISSN: 0951-4198
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