Investigation of Generation of Defects Due to Metallization on Cdznte Detectors

AuthID
P-002-A5J
11
Author(s)
Zheng, Q
·
Dierre, F
·
Franc, J
·
Crocco, J
·
Bensalah, H
·
Ruiz, E
·
Vela, O
·
Perez, JM
·
Dieguez, E
Tipo de Documento
Article
Year published
2012
Publicado
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 45, Número: 17, Páginas: 175102 (6)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84859779949
Wos: WOS:000303538000005
Source Identifiers
ISSN: 0022-3727
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