Voids in Kesterites and the Influence of Lamellae Preparation by Focused Ion Beam for Transmission Electron Microscopy Analyses

AuthID
P-00Q-8W3
8
Author(s)
Ribeiro Andrade, R
·
Sahayaraj, S
·
Vermang, B
·
Sadewasser, S
·
Gonzalez, JC
·
Salome, PMP
Tipo de Documento
Article
Year published
2019
Publicado
in IEEE JOURNAL OF PHOTOVOLTAICS, ISSN: 2156-3381
Volume: 9, Número: 2, Páginas: 565-570 (6)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-85062268596
Wos: WOS:000459507000028
Source Identifiers
ISSN: 2156-3381
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