A Dynamic Jitter Model to Evaluate Uncertainty Trends with Technology Scaling

AuthID
 P-002-CH2
2
Author(s)
Tipo de Documento
Article
Year published
2012
Publicado
in INTEGRATION-THE VLSI JOURNAL, ISSN: 0167-9260
Volume: 45, Número: 2, Páginas: 162-171 (10)
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Publication Identifiers
SCOPUS: 2-s2.0-84856701125
Wos: WOS:000301767100006
Source Identifiers
ISSN: 0167-9260
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