Electron and Hole Trapping in Eu- or Eu,Hf-Doped Lupo4 and Ypo4 Tracked by Epr and Tsl Spectroscopy

AuthID
 P-00R-3XF
6
Author(s)
Laguta, V
·
Buryi, M
·
Nikl, M
·
Zeler, J
·
Bettinelli, M
Tipo de Documento
Article
Year published
2019
Publicado
in JOURNAL OF MATERIALS CHEMISTRY C, ISSN: 2050-7526
Volume: 7, Número: 37, Páginas: 11473-11482 (10)
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-85072699615
Wos: WOS:000487941000008
Source Identifiers
ISSN: 2050-7526
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