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Defect Classification With Svm and Wideband Excitation in Multilayer Aluminum Plates
AuthID
P-00R-FSX
5
Author(s)
Pasadas, DJ
·
Ramos, HG
·
Feng, B
·
Baskaran, P
·
Ribeiro, AL
Document Type
Article
Year published
2020
Published
in
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
ISSN: 0018-9456
Volume: 69, Issue: 1, Pages: 241-248 (8)
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DOI
:
10.1109/tim.2019.2893009
Wos
: WOS:000502787500026
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ISSN
: 0018-9456
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