Defect Classification With Svm and Wideband Excitation in Multilayer Aluminum Plates

AuthID
 P-00R-FSX
5
Author(s)
Pasadas, DJ
·
Feng, B
·
Baskaran, P
·
Ribeiro, AL
Tipo de Documento
Article
Year published
2020
Publicado
in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456
Volume: 69, Número: 1, Páginas: 241-248 (8)
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Scopus®
Crossref®22
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Publication Identifiers
SCOPUS: 2-s2.0-85070395902
Wos: WOS:000502787500026
Source Identifiers
ISSN: 0018-9456
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