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Development of Early Process Control Indicators for Reliability Drop Test Performance of Ewlb Products

AuthID
P-002-F3F

Author(s)

Azevedo, A

Cardoso, A

Teixeira, J

Tavares, O

Marques, R

Tipo de Documento

Proceedings Paper

Year published

2012

Publicado

in 2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), ISSN: 0569-5503

Páginas: 776-780 (5)

Conference

62Nd Ieee Electronic Components and Technology Conference (Ectc), Date: MAY 29-JUN 01, 2012, Location: San Diego, CA, Patrocinadores: IEEE, IEEE Components, Packaging & Mfg Technol Soc (CPMT)

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Publication Identifiers

DOI: 10.1109/ectc.2012.6248920

SCOPUS: 2-s2.0-84866846170

Wos: WOS:000309162000124

Source Identifiers

ISSN: 0569-5503

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Development of Early Process Control Indicators for Reliability Drop Test Performance of Ewlb Products

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