Experimental Evaluation of Sic Mosfet and Gan Hemt Losses in Inverter Operation

AuthID
 P-00S-2BW
3
Author(s)
Costa, PBC
·
Silva, JF
·
Tipo de Documento
Proceedings Paper
Year published
2019
Publicado
in IECON Proceedings (Industrial Electronics Conference)
Volume: 2019-October, Páginas: 6595-6600
Conference
45Th Annual Conference of the Ieee Industrial Electronics Society, Iecon 2019, Date: 14 October 2019 through 17 October 2019, Patrocinadores: IEEE;IEEE Industrial Electronics Society (IES)
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Publication Identifiers
SCOPUS: 2-s2.0-85084116544
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