Investigation of Local Conduction Mechanisms in Ca and Ti-Doped Bifeo3 Using Scanning Probe Microscopy Approach

AuthID
 P-00S-ANY
7
Author(s)
Silibin, MV
·
Blawert, C
·
Tipo de Documento
Article
Year published
2020
Publicado
in NANOMATERIALS, ISSN: 2079-4991
Volume: 10, Número: 5, Páginas: 940 (9)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85086402185
Wos: WOS:000540781800123
Source Identifiers
ISSN: 2079-4991
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service