Nanoscale Stereometric Evaluation of Bizn0.5Ti0.5O3 Thin Films Grown by Rf Magnetron Sputtering

AuthID
P-00S-JZ6
6
Author(s)
Almeida, ADM
·
Brito, WR
·
Matos, RS
·
Filho, HD
Tipo de Documento
Article
Year published
2020
Publicado
in MATERIALS LETTERS, ISSN: 0167-577X
Volume: 279, Páginas: 128477 (5)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-85089244964
Wos: WOS:000576753600010
Source Identifiers
ISSN: 0167-577X
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