Piezoelectric Properties of Pb1-Xlax(Zr0.52Ti0.48)(1-X/4)O(3)Thin Films Studied by In Situ X-Ray Diffraction

AuthID
 P-00S-M6C
7
Author(s)
Cornelius, TW
·
Mocuta, C
·
Escoubas, S
·
Lima, LRM
·
Araujo, EB
·
Thomas, O
Tipo de Documento
Article
Year published
2020
Publicado
in MATERIALS, ISSN: 1996-1944
Volume: 13, Número: 15, Páginas: 3338 (12)
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Publication Identifiers
SCOPUS: 2-s2.0-85089731211
Wos: WOS:000559182700001
Source Identifiers
ISSN: 1996-1944
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