Ingan Epilayer Characterization by Microfocused X-Ray Reciprocal Space Mapping

AuthID
 P-002-KDM
6
Author(s)
Dolbnya, IP
·
O'Donnell, KP
·
Edwards, PR
·
Tipo de Documento
Article
Year published
2011
Publicado
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 99, Número: 18, Páginas: 181909 (3)
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Publication Identifiers
SCOPUS: 2-s2.0-80855141616
Wos: WOS:000296659400040
Source Identifiers
ISSN: 0003-6951
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