A Relationship Between Technostress, Satisfaction At Work, Organizational Commitment And Demography: Evidence From The Brazilian Public Sector

AuthID
 P-00T-56D
5
Author(s)
Marchiori, DM
·
Felix, ACS
·
Mainardes, EW
·
Popadiuk, S
·
Tipo de Documento
Article
Year published
2020
Publicado
in REVISTA GESTAO & TECNOLOGIA-JOURNAL OF MANAGEMENT AND TECHNOLOGY, ISSN: 1677-9479
Volume: 20, Número: 4, Páginas: 176-201 (26)
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Publication Identifiers
Wos: WOS:000593138500009
Source Identifiers
ISSN: 1677-9479
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