Evaluation of Bias Voltage-Dependent Mechanical Properties of Amorphous Tisi2 Thin Films on Peek by Nano-Characterization Techniques

AuthID
 P-00T-CG2
3
Author(s)
Frutos, E
·
Jimenez, JA
Tipo de Documento
Article
Year published
2021
Publicado
in SURFACE & COATINGS TECHNOLOGY, ISSN: 0257-8972
Volume: 409, Páginas: 126859 (10)
Indexing
Wos®
Scopus®
Crossref®2
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85099810229
Wos: WOS:000654045600048
Source Identifiers
ISSN: 0257-8972
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service