Hot Hole Transport Through Au/N-Si(100) Studied by Reverse Ballistic Electron Emission Microscopy and Spectroscopy

AuthID
 P-00T-P32
5
Author(s)
Coratger, R
·
Ajustron, F
·
Beauvillain, J
Tipo de Documento
Article
Year published
2000
Publicado
in Surface Science, ISSN: 0039-6028
Volume: 462, Número: 1, Páginas: 61-67
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Publication Identifiers
SCOPUS: 2-s2.0-0034245203
Source Identifiers
ISSN: 0039-6028
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