Controlled Modifications of Electron Injection on Au/Si and Au/Sio2/Si Contacts Using Ballistic Electron Emission Microscopy

AuthID
 P-00T-P33
7
Author(s)
Coratger, R
·
Pascale, A
·
Baules, P
·
Ajustron, F
·
Zorkani, I
·
Beauvillain, J
Tipo de Documento
Article
Year published
2001
Publicado
in Journal of Applied Physics, ISSN: 0021-8979
Volume: 89, Número: 11 I, Páginas: 6302-6307
Indexing
Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-0035356431
Source Identifiers
ISSN: 0021-8979
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