Swept Notch Npr for Linearity Assessment of Systems Presenting Long-Term Memory Effects

AuthID
 P-00V-9Z3
4
Author(s)
Figueiredo, R
·
Piacibello, A
·
Carvalho, NB
Tipo de Documento
Proceedings Paper
Year published
2020
Publicado
in 2020 95TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG): MICROWAVE AND MILLIMETER-WAVE MEASUREMENTS FOR THE CONNECTED WORLD
Conference
95Th Arftg Microwave Measurement Conference (Arftg), Date: JUN 26, 2020, Location: ELECTR NETWORK, Patrocinadores: ARFTG, IEEE, IEEE MTT S
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Publication Identifiers
Wos: WOS:000675608700018
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