Study of the Piezoresistivity of Doped Nanocrystalline Silicon Thin Films

AuthID
 P-002-QEZ
8
Author(s)
Gaspar, J
·
Gieschke, P
·
Ehling, C
·
Kistner, J
·
Paul, O
Tipo de Documento
Article
Year published
2011
Publicado
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 109, Número: 12, Páginas: 123717 (9)
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Publication Identifiers
SCOPUS: 2-s2.0-79960187325
Wos: WOS:000292331200066
Source Identifiers
ISSN: 0021-8979
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