A New Imaeing Technology Based on Compton X-Ray Scattering

AuthID
 P-00V-DCF
5
Author(s)
Hernandez, AS
·
Gonzalez Diaz, D
·
Azevedo, C
·
Seoane, M
Tipo de Documento
Article
Year published
2021
Publicado
in JOURNAL OF SYNCHROTRON RADIATION
Volume: 28, Páginas: 1558-1572 (15)
Conference
11Th International Workshop on X-Ray Radiation Damage to Biological Crystalline Samples, Date: OCT 14-16, 2020, Location: ELECTR NETWORK
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Publication Identifiers
Wos: WOS:000693111600029
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