Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks

AuthID
 P-00V-QMM
7
Author(s)
Lopes, F
·
Leal, A
·
Medeiros, J
·
Pinto, MF
·
Dumpelmann, M
·
Tipo de Documento
Article
Year published
2021
Publicado
in IEEE ACCESS, ISSN: 2169-3536
Volume: 9, Páginas: 149955-149970 (16)
Conference
Ieee Access
Indexing
Wos®
Scopus®
Crossref®20
Handle®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85119620464
Wos: WOS:000717765700001
Source Identifiers
ISSN: 2169-3536
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