Oxidation of Freestanding Silicon Nanocrystals Probed with Electron Spin Resonance of Interfacial Dangling Bonds

AuthID
 P-002-SAX
4
Author(s)
Rowe, DJ
·
Anthony, RJ
·
Kortshagen, U
Tipo de Documento
Article
Year published
2011
Publicado
in PHYSICAL REVIEW B, ISSN: 1098-0121
Volume: 83, Número: 15
Indexing
Wos®
Scopus®
Crossref®44
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-79961110682
Wos: WOS:000292151200005
Source Identifiers
ISSN: 1098-0121
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