Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy

AuthID
 P-00V-XS4
11
Author(s)
Alikin, D
·
Abramov, A
·
Turygin, A
·
Ievlev, A
·
Pryakhina, V
·
Hu, QY
·
Jin, L
·
Shur, V
·
Tselev, A
·
Kholkin, A
Tipo de Documento
Article in Press
Year published
2021
Publicado
in SMALL METHODS, ISSN: 2366-9608
Volume: 6, Número: 2
Indexing
Wos®
Scopus®
Crossref®10
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85122073540
Wos: WOS:000735904000001
Source Identifiers
ISSN: 2366-9608
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