A Review of Memory Effects in Algan/Gan Hemt Based Rf Pas

AuthID
 P-00W-4SK
7
Author(s)
Tome, P
·
Cunha, T
·
Barradas, F
·
Nunes, L
·
Gomes, J
Tipo de Documento
Proceedings Paper
Year published
2021
Publicado
in 2021 IEEE MTT-S INTERNATIONAL WIRELESS SYMPOSIUM (IWS 2021)
Conference
8Th Ieee Mtt-S International Wireless Symposium (Iws) Part of China Microwave Week, Date: MAY 23-26, 2021, Location: Nanjing, PEOPLES R CHINA, Patrocinadores: IEEE Microwave Theory & Tech Soc, Chinese Inst Elect, Microwave Soc, SE Univ, Shanghai Jiao Tong Univ, Nanjing Univ Sci & Technol, Nanjing Univ Posts & Telecommunicat, Nanjing Univ, Nanjing Univ Aeronaut & Astronaut, Nanjing Univ Informat Sci & Technol, IEEE Nanjing Sect, IEEE AP MTT EMC Joint Nanjing Chapter
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Publication Identifiers
SCOPUS: 2-s2.0-85124555581
Wos: WOS:000790800700015
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