Electro-Thermal and Trapping Characterization of Algan/Gan Rf Power Hemts

AuthID
 P-00W-8B6
3
Author(s)
Gomes, J
·
Nunes, L
Tipo de Documento
Proceedings Paper
Year published
2021
Publicado
in 2021 IEEE BICMOS AND COMPOUND SEMICONDUCTOR INTEGRATED CIRCUITS AND TECHNOLOGY SYMPOSIUM (BCICTS)
Conference
Ieee Bicmos and Compound Semiconductor Integrated Circuits and Technology Symposium (Bcicts), Date: DEC 06-09, 2021, Location: ELECTR NETWORK, Patrocinadores: IEEE
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Publication Identifiers
SCOPUS: 2-s2.0-85125795927
Wos: WOS:000783355500004
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