Simulation and Modelling of Resonant Tunneling Diode Peak Voltage Dependence on Spacer Layers

AuthID
P-00W-BGJ
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2021
Publicado
in 35TH SYMPOSIUM ON MICROELECTRONICS TECHNOLOGY AND DEVICES (SBMICRO2021)
Conference
35Th Symposium on Microelectronics Technology and Devices (Sbmicro), Date: AUG 23-27, 2021, Location: Campinas, BRAZIL, Patrocinadores: IEEE,IEEE Circuits & Syst Soc,IEEE Council Electron Design Automat,Unicamp,Soc Brasileira Microelectronica,Soc Brasileira Computacao,ACM SIGDA,IFIP,Electron Devices Soc,IEEE Instrumentat & Measurement Soc,Soc Brasileira Fis,Soc Brasileira Automatica,Keysight Technologies,Assoc Brasileira Ind Semicond,Silvaco,Idea,Smart Modular Technologies,Flanders Investment & Trade,Chipus,Imec
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Publication Identifiers
SCOPUS: 2-s2.0-85126137164
Wos: WOS:000861678700014
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