Reliability Levels of the Tests

AuthID
 P-00W-MT3
14
Author(s)
Oliveira, R
·
Silva, R
·
Akyildiz, Z
·
Ceylan, HI
·
González, JR
·
Fernández, FTG
·
Araújo, R
·
Lima, R
·
Silva, B
·
Matos, S
·
Chen, YS
·
Afonso, J
Tipo de Documento
Book Chapter
Year published
2022
Publicado
in SpringerBriefs in Applied Sciences and Technology, ISSN: 2191-530X
Páginas: 33-85
Indexing
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Publication Identifiers
SCOPUS: 2-s2.0-85130819522
Source Identifiers
ISSN: 2191-530X
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