Characterization of the Interfacial Defect Layer in Chalcopyrite Solar Cells by Depth-Resolved Muon Spin Spectroscopy

AuthID
 P-00W-P56
14
Author(s)
Ribeiro, EFM
·
Curado, MA
·
Teixeira, JP
·
Fernandes, PA
·
Cunha, JMV
·
Salome, PMP
·
Edoff, M
·
Martins, MI
·
Prokscha, T
·
Salman, Z
·
Weidinger, A
Tipo de Documento
Article in Press
Year published
2022
Publicado
in ADVANCED MATERIALS INTERFACES, ISSN: 2196-7350
Volume: 9, Número: 19
Indexing
Wos®
Scopus®
Crossref®4
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85131314063
Wos: WOS:000807104200001
Source Identifiers
ISSN: 2196-7350
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