A Reconstruction Method for Linear Sensor Microscopy Based on Improvement of Lateral Resolution Isotropy

AuthID
 P-002-XD0
2
Author(s)
2
Editor(es)
So,PTC;Beaurepaire,E
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in ADVANCED MICROSCOPY TECHNIQUES II in Proceedings of SPIE, ISSN: 0277-786X
Volume: 8086
Conference
Conference on Advanced Microscopy Techniques Ii, Date: MAY 22-24, 2011, Location: Munich, GERMANY, Patrocinadores: SPIE, Opt Soc Amer
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Publication Identifiers
SCOPUS: 2-s2.0-79960500921
Wos: WOS:000293164900026
Source Identifiers
ISSN: 0277-786X
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