Ultrasound Interferometry for the Evaluation of Thickness and Adhesion of Thin Layers

AuthID
 P-002-XF5
2
Author(s)
Tipo de Documento
Article
Year published
2011
Publicado
in INTERNATIONAL JOURNAL OF MATERIALS & PRODUCT TECHNOLOGY, ISSN: 0268-1900
Volume: 41, Número: 1-4, Páginas: 153-161 (9)
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Publication Identifiers
SCOPUS: 2-s2.0-79957666692
Wos: WOS:000292408600013
Source Identifiers
ISSN: 0268-1900
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