On the Bias of Terminal Based Gain and Offset Estimation Using the Adc Histogram Test Method

AuthID
 P-002-XM9
2
Author(s)
Tipo de Documento
Article
Year published
2011
Publicado
in METROLOGY AND MEASUREMENT SYSTEMS, ISSN: 0860-8229
Volume: 18, Número: 1, Páginas: 3-12 (10)
Indexing
Wos®
Publication Identifiers
Wos: WOS:000289491200001
Source Identifiers
ISSN: 0860-8229
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service