Impact Analysis of Kpi Scenarios, Automated Best Practices Identification, and Deviations on Manufacturing Processes

AuthID
 P-00X-HDG
2
Author(s)
Lopes, MJ
·
Tipo de Documento
Proceedings Paper
Year published
2022
Publicado
in 2022 IEEE 27TH INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION (ETFA) in IEEE International Conference on Emerging Technologies and Factory Automation-ETFA, ISSN: 1946-0740
Volume: 2022-September
Conference
Ieee 27Th International Conference on Emerging Technologies and Factory Automation (Etfa), Date: SEP 06-09, 2022, Location: Stuttgart, GERMANY
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Publication Identifiers
SCOPUS: 2-s2.0-85141433394
Wos: WOS:000934103900040
Source Identifiers
ISSN: 1946-0740
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