Single Trial Detection of Error-Related Potentials in Brain-Machine Interfaces: a Survey and Comparison of Methods

AuthID
 P-00X-TJB
4
Author(s)
Yasemin, M
·
Cruz, A
·
Tipo de Documento
Article
Year published
2023
Publicado
in JOURNAL OF NEURAL ENGINEERING, ISSN: 1741-2560
Volume: 20, Número: 1, Páginas: 016015 (24)
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Wos®
Scopus®
Crossref®11
Pubmed®
Google Scholar®
Publication Identifiers
Pubmed: 36595316
SCOPUS: 2-s2.0-85146484470
Wos: WOS:000916474600001
Source Identifiers
ISSN: 1741-2560
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