Non-Destructive Banana Ripeness Detection Using Shallow and Deep Learning: A Systematic Review

AuthID
P-00X-VDJ
6
Author(s)
Baglat, P
·
Hayat, A
·
Mendonca, F
·
Gupta, A
·
Mostafa, SS
·
Tipo de Documento
Review
Year published
2023
Publicado
in SENSORS, ISSN: 1424-8220
Volume: 23, Número: 2, Páginas: 738 (20)
Indexing
Publication Identifiers
Pubmed: 36679535
SCOPUS: 2-s2.0-85146713301
Wos: WOS:000916315800001
Source Identifiers
ISSN: 1424-8220
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